YOU, K. Y.; ABBAS, Z.; LEE, C. Y.; MALEK, M. F. A.; LEE, K. Y. et al. Modelling and Measuring Dielectric Constants for Very Thin Materials Using a Coaxial Probe. Online. Radioengineering. 2014, vol. 23, no. 4, s. 1016-1025. ISSN 1210-2512. Dostupné z: http://hdl.handle.net/11012/36557. [cit. 2025-04-29].