WANG, Laung-Terng. System-on-chip test architectures: nanometer design for testability. Systems on silicon. Amsterdam: Elsevier, 2007. ISBN 9780123739735. Dostupné také z: https://proxy.k.utb.cz/login?url=http://app.knovel.com/hotlink/toc/id:kpSCTANDT1/systemonchip_test_architectures__nanometer_design_for_testability.